SiT1534AC-J5-DCC-00.256

Device Type 1 Hz to 462.5 kHz Oscillators
Frequency
0.256 kHz
Frequency Stability (ppm)
75
Operating Temp. Range (°C)
-10 to 70
Output Type
LVCMOS
Supply Voltage (V)
1.20 to 3.63
Package Size (mm x mm)
1.5x0.8
Package Height (mm)
0.60
Output Drive Strength*
Default
Feature Pin
n/a
Pull Range (PPM PR)
n/a
Spread Percentage
n/a
Swing Select
n/a
DC-Coupled Output VOL or AC Swing
Rail-to-Rail LVCMOS
DC-Coupled Output VOH
Rail-to-Rail LVCMOS
RoHS
Yes

*See datasheet for details

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Tape & Reel Options
D = 3,000 ct
E = 1,000
G = 250 ct
Q = 5,000 ct

Factory programmable down to 1 Hz

  • Significantly reduces power compared to fixed 32.768 kHz XTAL

Smallest footprint in chip-scale (CSP): 1.5 x 0.8 mm

  • Saves board space by up to 80% compared to the 2012 SMD

Small SMD package: 2.0 x 1.2 mm (2012)

  • Pin-compatible to 2012 XTAL SMD

NanoPower: 900 nA (typ.)

  • Extends battery life

Operates down to 1.2 V

  • Supports coin-cell or supercap battery backup

NanoDrive™ reduced swing oscillator output

  • Directly interfaces to MCU/PMIC/chipset XTAL IN
  • Programmable output swing minimizes power
  • Oscillator output eliminates load capacitor

No load or VDD filtering capacitors

  • Eliminates any external capacitors
  • Eliminates any external capacitors
  • Eliminates load dependent startup issues

<100 ppm frequency stability over -40 °C to +85 °C temp. range

  • 2 x和石英相比更好的稳定性
  • Improves wireless connectivity and RTC accuracy

  • Wireless mouse
  • Wireless keypads
  • Pulse-per-second (PPS) timekeeping
  • RTC reference clock
  • Battery management timekeeping

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Resource Name Type
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
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MEMS oscillators improve reliability and system performance in motor control applications White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
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Smart Clocking Techniques Extend Battery Life of Wearables Presentations
SiT1534 Datasheet Datasheets
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
J-AN10037 低消費電力MCUの32 kHz発振動作モードに対する SiT15xx製品の最適なドライブ出力設定 Application Notes
AN10037 Optimized SiT15xx Drive Settings for 32 kHz Inputs of Low Power MCUs Application Notes
J-AN10043 SiT15xxシリーズ(32 kHz発振器)の測定ガイドライン Application Notes
AN10043 Measurement Guidelines for 32 kHz SiT15xx Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
J-AN10046 32 kHz Nano-Power MEMS 発振器による複数負荷駆動 Application Notes
AN10046 Driving Multiple Loads with 32 kHz Nano-Power MEMS Oscillators Application Notes
SiTimeの MEMS First™ プロセス技術 Technology Papers
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
Phase Noise Measurement Tutorial Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
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How SiTime Saves Space for IOT, Wearable, and Mobile Applications Videos
CSP 1508 4-Pins 3D Step Models
SMD 2012 4-Pins 3D Step Models
SiTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
Timing Solutions for Mobile & IoT Brochures/Fliers
SiT6098EBB Evaluation Board User Manual User Manuals
Silicon Replaces Quartz (Japanese Subtitles) Videos
Silicon Replaces Quartz (Chinese Subtitles) Videos
Smart Meters Application Briefs
SiT1534 (LVCMOS, 1.5 V) IBIS Models
SiT1534 (LVCMOS, 1.8 V) IBIS Models
SiT1534 (LVCMOS, 3.3 V) IBIS Models
SiTime MEMS First 工艺 Technology Papers
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes