坐2001BC-S2-33S-12.288000

Device Type LVCMOS Oscillators
Frequency
12.288 MHz
Frequency Stability (ppm)
25
Operating Temp. Range (°C)
-20 to 70
Output Type
LVCMOS
电源电压(V)
3.30
Package Size (mm x mm)
SOT23(2.9x2.8)
Package Height (mm)
1.45
Output Drive Strength*
Default
Feature Pin
Standby
Pull Range (PPM PR)
n/a
传播百分比
n/a
Swing Select
n/a
DC-Coupled Output VOL or AC Swing
n/a
DC-Coupled Output VOH
n/a
RoHS
Yes

*See datasheet for details

Tape & Reel Options

D = 3,000 ct
E = 1,000
G = 250 ct

Configurable feature sets

  • Any frequency between 1 to 110 MHz with 6 decimal places of accuracy
  • Stability from ±20 ppm to ±50 ppm
  • Industrial or extended commercial temp.
  • 1.8 V or 2.5 V to 3.3 V supply voltage:
  • Customize specification for optimal system performance
  • Use same base device for many design, reducing qualification needs;

SOT23 package

  • Lowest cost package
  • 最佳板级焊点可靠性
  • Easy optical only board-level inspection of solder joints;

FlexEdge™ drive strength

  • Slower rise/fall time that minimizes EMI from the oscillator
  • Saves cost by driving multiple loads and eliminate additional timing components;

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • 减轻短缺风险

  • Ethernet
  • Firewire
  • USB
  • Audio & video
  • SATA/SAS
  • Fibre channel
  • Solid-state drives (SSD)
  • Storage, servers and datacenters
  • Computer servers
  • Processor clocking
  • FPGA clocking
  • Networking switches and gateways
  • CCTV and surveillance equipment
  • Industrial probes and equipment
  • Medical devices
  • Factory automation

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Evaluation Board(Contact SiTime)坐6097 (2928 SOT23-5)

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Narrow By:

Resource Name Type
坐2001 3.57MHz LVCMOS Freq. Test Reports
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SIT2001 4MHz LVCMOS. Freq. Test Reports
坐2001 6MHz LVCMOS Freq. Test Reports
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SiT2001 37.5 mhz LVCMOS Freq. Test Reports
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坐2001 38MHz LVCMOS Freq. Test Reports
坐2001 40.5MHz LVCMOS Freq. Test Reports
坐2001 40MHz LVCMOS Freq. Test Reports
坐2001 48MHz LVCMOS Freq. Test Reports
坐2001 50MHz LVCMOS Freq. Test Reports
SIT2001 54MHz LVCMOS. Freq. Test Reports
坐2001 66.6MHz LVCMOS Freq. Test Reports
SIT2001 66.66MHz LVCMOS. Freq. Test Reports
坐2001 66.666MHz LVCMOS Freq. Test Reports
坐2001 66.6666MHz LVCMOS Freq. Test Reports
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坐2001 72MHz LVCMOS Freq. Test Reports
坐2001 74.25MHz LVCMOS Freq. Test Reports
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坐2001 75MHz LVCMOS Freq. Test Reports
坐2001 77.76MHz LVCMOS Freq. Test Reports
坐2001 100MHz LVCMOS Freq. Test Reports
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坐2001 Datasheet 数据表
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AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
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坐2001 (LVCMOS, 3.0 V) IBIS Models
坐2001 (LVCMOS, 3.3 V) IBIS Models
坐2001 (LVCMOS, 2.25 to 3.63 V) IBIS Models
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
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AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes