坐2001BC-S3-33E-20.000000

Device Type lvcmos.Oscillators
Frequency
20 MHz
Frequency Stability (ppm)
50.
Operating Temp. Range (°C)
-20到70
Output Type
lvcmos.
Supply Voltage (V)
3.30
Package Size (mm x mm)
SOT23 (2.9x2.8)
包装高度(mm)
1.45
Output Drive Strength*
Default
Feature Pin
Output Enable
拉伸范围(PPM PR)
N / A.
Spread Percentage
N / A.
Swing Select
N / A.
DC-Coupled Output VOL or AC Swing
N / A.
DC-Coupled Output VOH
N / A.
RoHS
是的

*See datasheet for details

Tape & Reel Options

D = 3,000 ct
E = 1,000
g = 250 ct

Configurable feature sets

  • Any frequency between 1 to 110 MHz with 6 decimal places of accuracy
  • 稳定性为±20 ppm至±50 ppm
  • Industrial or extended commercial temp.
  • 1.8 V或2.5 V至3.3 V电源电压:
  • Customize specification for optimal system performance
  • Use same base device for many design, reducing qualification needs;

SOT23包

  • Lowest cost package
  • Best board-level solder joint reliability
  • Easy optical only board-level inspection of solder joints;

FlexEdge™ drive strength

  • Slower rise/fall time that minimizes EMI from the oscillator
  • 通过驱动多个负载来节省成本并消除额外的定时组件;

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • Mitigate shortage risks

  • Ethernet
  • Firewire
  • USB
  • Audio & video
  • SATA / SA.
  • Fibre channel
  • Solid-state drives (SSD)
  • Storage, servers and datacenters
  • Computer servers
  • 处理器时钟
  • FPGA clocking
  • 网络交换机和网关
  • CCTV和监视设备
  • Industrial probes and equipment
  • 医疗设备
  • 工厂自动化

Narrow By:

Document Name 类型
5L-SOT23 Package Composition Report 组成报告
电子行业公民联盟模板 Other Quality Documents
SINTIME产品的制造票据 Other Quality Documents
SiTime Conflict Metal Declaration Other Quality Documents
环境政策环境政策 Other Quality Documents
SiTime Warranty on Date Code Other Quality Documents
ISO9001:2015 Certificate of Registration Other Quality Documents
Conflict Minerals Reporting Template Other Quality Documents
5L-SOT23 Package Qualification Report - Carsem Reliability Reports
SiTime Oscillator Reliability Report (0.18 micron CMOS process products) Reliability Reports
坐1602 Product Qualification Report Reliability Reports
坐16XX, SiT89XX High Temp Product Qualification Report Reliability Reports
SOT23 Package UTAC Reliability Report Reliability Reports
TSMC Wafer SGS Report RoHS/Reach/Green Certificates
Tower Jazz Wafer SGS Report RoHS/Reach/Green Certificates
5L-SOT23 Package Homogeneous Materials and SGS Report – Carsem RoHS/Reach/Green Certificates
BOSCH Wafer SGS Report RoHS/Reach/Green Certificates
WLCSP Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
SiTime Environmental Compliance Declaration RoHS/Reach/Green Certificates
Certificate of Compliance-EU RoHS Declaration RoHS/Reach/Green Certificates
5L-SOT23 Package Homogeneous Materials and SGS Report - UTAC RoHS/Reach/Green Certificates

评估板(Contact SiTime)坐6097 (2928 SOT23-5)

Time Machine II Programmer– Program frequency, voltage, stability & more

Frequency Slope (dF/dT) Calculator——计算频率斜率温度

SOT 23 5-Pins3D步骤模型– Preview oscillator packages in 3D

Narrow By:

Resource Name 类型
SIT2001 3.57MHz LVCMOS. Freq. Test Reports
坐2001 4.096MHz LVCMOS Freq. Test Reports
坐2001 4MHz LVCMOS Freq. Test Reports
坐2001 6MHz LVCMOS Freq. Test Reports
SIT2001 7.3728MHz LVCMOS. Freq. Test Reports
坐2001 8.192MHz LVCMOS Freq. Test Reports
坐2001 10MHz LVCMOS Freq. Test Reports
坐2001 12MHz LVCMOS Freq. Test Reports
SIT2001 14MHz LVCMOS. Freq. Test Reports
SIT2001 18.432MHz LVCMOS. Freq. Test Reports
SIT2001 19.2MHz LVCMOS. Freq. Test Reports
坐2001 24.576MHz LVCMOS Freq. Test Reports
SIT2001 25MHz LVCMOS. Freq. Test Reports
SIT2001 26MHz LVCMOS. Freq. Test Reports
SIT2001 27MHz LVCMOS. Freq. Test Reports
SIT2001 28.6363MHz LVCMOS. Freq. Test Reports
SIT2001 30MHz LVCMOS. Freq. Test Reports
坐2001 31.25MHz LVCMOS Freq. Test Reports
坐2001 32.768MHz LVCMOS Freq. Test Reports
SIT2001 33.3MHz LVCMOS. Freq. Test Reports
SIT2001 33.33MHz LVCMOS. Freq. Test Reports
SIT2001 33.333MHz LVCMOS. Freq. Test Reports
坐2001 33.3333MHz LVCMOS Freq. Test Reports
坐2001 33MHz LVCMOS Freq. Test Reports
坐2001 37.5MHz LVCMOS Freq. Test Reports
坐2001 38.4MHz LVCMOS Freq. Test Reports
坐2001 38MHz LVCMOS Freq. Test Reports
坐2001 40.5MHz LVCMOS Freq. Test Reports
SIT2001 40MHz LVCMOS. Freq. Test Reports
坐2001 48MHz LVCMOS Freq. Test Reports
坐2001 50MHz LVCMOS Freq. Test Reports
坐2001 54MHz LVCMOS Freq. Test Reports
坐2001 66.6MHz LVCMOS Freq. Test Reports
坐2001 66.66MHz LVCMOS Freq. Test Reports
坐2001 66.666MHz LVCMOS Freq. Test Reports
坐2001 66.6666MHz LVCMOS Freq. Test Reports
坐2001 66.66666MHz LVCMOS Freq. Test Reports
坐2001 72MHz LVCMOS Freq. Test Reports
坐2001 74.25MHz LVCMOS Freq. Test Reports
SIT2001 74.176MHz LVCMOS. Freq. Test Reports
坐2001 74.175824MHz LVCMOS Freq. Test Reports
坐2001 75MHz LVCMOS Freq. Test Reports
坐2001 77.76MHz LVCMOS Freq. Test Reports
SIT2001 100MHz LVCMOS. Freq. Test Reports
Silicon MEMS Reliability and Resilience 介绍
性能比较:硅MEMS经验石英振荡器 介绍
How to Measure Clock Jitter in Precision Timing Applications 介绍
如何测量精密定时应用中的相位抖动和相位噪声 介绍
How to Get Instant Oscillators with SiTime's New Field Programmer 介绍
Silicon Mems VS石英供应链 介绍
Silicon MEMS Oscillators Provide Benefits for LED Lighting White Papers
MEMS Timing Solutions Improve Touchscreen Devices White Papers
Field Programmable Timing Solutions for Medical Applications White Papers
超强鲁棒MEMS定时解决方案提高了仪表应用中的性能和可靠性 White Papers
MEMS振荡器在电机控制应用中提高可靠性和系统性能 White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz 介绍
与MEMS联系:机电接口 介绍
Field Programmable Oscillators Datasheet Datasheets
SIT2001数据表 Datasheets
Time Machine II MEMS Oscillator Programmer 产品简介
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007时钟抖动定义和测量方法 Application Notes
J-AN10007クロックジッタクロックジッタの定义と方法 Application Notes
SiTime発振器の信頼性計算方法 技术论文
AN10025恒化振荡器的可靠性计算 Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振の电阻场感受率の比较 技术论文
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators 技术论文
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) 技术论文
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators 技术论文
J-AN10033仪器の周波数量ガイドライン Application Notes
AN10033振荡器频率测量指南 Application Notes
シリコンMEMS発振器材のおよび函数性 技术论文
硅MEMS振荡器的弹性和可靠性 技术论文
SiTimeの MEMS First™ プロセス技術 技术论文
SiTime's MEMS First™ and EpiSeal™ Processes 技术论文
The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 介绍
如何测量精密定时应用中的长期抖动和周期到循环抖动 介绍
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques 介绍
SIT2001(LVCMOS,1.8 V) IBIS Models
SIT2001(LVCMOS,2.5 V) IBIS Models
坐2001 (LVCMOS, 2.8 V) IBIS Models
坐2001 (LVCMOS, 3.0 V) IBIS Models
坐2001 (LVCMOS, 3.3 V) IBIS Models
坐2001 (LVCMOS, 2.25 to 3.63 V) IBIS Models
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
SC-AN10007时动词定义与送量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
相位噪声测量教程 Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer 介绍
MEMS时序的优点 - 参数 Videos
SiTime MEMS Oscillators - Revolutionizing the Timing Market Videos
Sentime的时间机器II - 第1部分:如何安装振荡器编程软件 Videos
SiTime's Time Machine II - Part 2: How to Program Field Programmable Oscillators Videos
培训模块:用振荡器取代晶体 Videos
SOT 23 5-Pins 3D步骤模型s
SiTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
SiTime MEMS Timing Solutions (A4) Brochures/Fliers
Sentime MEMS时序解决方案(A4)中文 Brochures/Fliers
Timing Solutions for Industrial Brochures/Fliers
Silicon Replaces Quartz (Japanese Subtitles) Videos
Silicon Replaces Quartz (Chinese Subtitles) Videos
Sentime Mems First工人 技术论文
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072通过检查确定相位噪声的主导来源 Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes