SIT2001BI-S2-18E-19.200000

Device Type LVCMOS Oscillators
频率
19.2 MHz
频率Stability (ppm)
25.
Operating Temp. Range (°C)
-40到85.
Output Type
LVCMOS
电源电压(V)
1.80
封装尺寸(mm x mm)
SOT23(2.9x2.8)
Package Height (mm)
1.45
输出驱动强度*
默认
特征PIN.
输出使能
Pull Range (PPM PR)
n/a
传播百分比
n/a
Swing Select
n/a
直流耦合输出Vol或AC Swing
n/a
DC-Coupled Output VOH
n/a
RoHS
Yes

*See datasheet for details

Tape & Reel Options

G = 250 ct

Configurable feature sets

  • 任何频率在1到110 MHz之间,具有6位小数精度
  • Stability from ±20 ppm to ±50 ppm
  • 工业或扩展商业温度。
  • 1.8 V or 2.5 V to 3.3 V supply voltage:
  • Customize specification for optimal system performance
  • 使用相同的基础设备进行许多设计,降低资格需求;

SOT23 package

  • Lowest cost package
  • 最佳板级焊点可靠性
  • Easy optical only board-level inspection of solder joints;

FlexEdge™驱动强度

  • 从振荡器最小化EMI的速度升高/下降时间
  • Saves cost by driving multiple loads and eliminate additional timing components;

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • 减轻短缺风险

  • Ethernet
  • firewire.
  • USB
  • 音频视频
  • SATA/SAS
  • 光纤通道
  • Solid-state drives (SSD)
  • Storage, servers and datacenters
  • Computer servers
  • Processor clocking
  • FPGA clocking
  • Networking switches and gateways
  • CCTV and surveillance equipment
  • 工业探针和设备
  • Medical devices
  • Factory automation

Narrow By:

Document Name Type
5L-SOT23封装组成报告 Composition Reports
Electronics Industry Citizen Coalition Template Other Quality Documents
Manufacturing Notes for SiTime Products Other Quality Documents
环境冲突金属宣言 Other Quality Documents
sitEnvironmental Policy Other Quality Documents
sitWarranty on Date Code Other Quality Documents
ISO9001:2015注册证书 Other Quality Documents
Conflict Minerals Reporting Template Other Quality Documents
5L-SOT23 Package Qualification Report - Carsem 可靠性报告
sitOscillator Reliability Report (0.18 micron CMOS process products) 可靠性报告
SIT1602产品资格报告 可靠性报告
SIT16XX,SIT89XX高温产品资格报告 可靠性报告
SOT23 Package UTAC Reliability Report 可靠性报告
TSMC晶圆SGS报告 RoHS/Reach/Green Certificates
塔爵士晶圆SGS报告 RoHS/Reach/Green Certificates
5L-SOT23包装均质材料和SGS报告 - CAREM RoHS/Reach/Green Certificates
博世晶圆SGS报告 RoHS/Reach/Green Certificates
WLCSP Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
环境合规声明 RoHS/Reach/Green Certificates
Certificate of Compliance-EU RoHS Declaration RoHS/Reach/Green Certificates
5L-SOT23套装均质材料和SGS报告 - UTAC RoHS/Reach/Green Certificates

Evaluation Board(Contact SiTime)坐6097 (2928 SOT23-5)

时间机器II程序员- 程序频率,电压,稳定性和更多

频率斜率(DF / DT)计算器- 计算频率斜率超过温度

sot 23 5-pins3D Step Model- 预览3D中的振荡器包

Narrow By:

Resource Name Type
坐2001 3.57MHz LVCMOS Freq. Test Reports
坐2001 4.096MHz LVCMOS Freq. Test Reports
SIT2001 4MHz LVCMOS. Freq. Test Reports
SIT2001 6MHz LVCMOS. Freq. Test Reports
坐2001 7.3728MHz LVCMOS Freq. Test Reports
SIT2001 8.192MHz LVCMOS. Freq. Test Reports
SIT2001 10MHz LVCMOS. Freq. Test Reports
SIT2001 12MHz LVCMOS. Freq. Test Reports
坐2001 14MHz LVCMOS Freq. Test Reports
坐2001 18.432MHz LVCMOS Freq. Test Reports
坐2001 19.2MHz LVCMOS Freq. Test Reports
SIT2001 24.576MHz LVCMOS. Freq. Test Reports
坐2001 25MHz LVCMOS Freq. Test Reports
坐2001 26MHz LVCMOS Freq. Test Reports
坐2001 27MHz LVCMOS Freq. Test Reports
坐2001 28.6363MHz LVCMOS Freq. Test Reports
坐2001 30MHz LVCMOS Freq. Test Reports
SIT2001 31.25MHz LVCMOS. Freq. Test Reports
坐2001 32.768MHz LVCMOS Freq. Test Reports
坐2001 33.3MHz LVCMOS Freq. Test Reports
坐2001 33.33MHz LVCMOS Freq. Test Reports
坐2001 33.333MHz LVCMOS Freq. Test Reports
坐2001 33.3333MHz LVCMOS Freq. Test Reports
坐2001 33MHz LVCMOS Freq. Test Reports
SIT2001 37.5MHz LVCMOS. Freq. Test Reports
坐2001 38.4MHz LVCMOS Freq. Test Reports
坐2001 38MHz LVCMOS Freq. Test Reports
SIT2001 40.5MHz LVCMOS. Freq. Test Reports
坐2001 40MHz LVCMOS Freq. Test Reports
SIT2001 48MHz LVCMOS. Freq. Test Reports
坐2001 50MHz LVCMOS Freq. Test Reports
SIT2001 54MHz LVCMOS. Freq. Test Reports
坐2001 66.6MHz LVCMOS Freq. Test Reports
SIT2001 66.66MHz LVCMOS. Freq. Test Reports
坐2001 66.666MHz LVCMOS Freq. Test Reports
SIT2001 66.6666MHz LVCMOS. Freq. Test Reports
SIT2001 66.66666MHz LVCMOS. Freq. Test Reports
坐2001 72MHz LVCMOS Freq. Test Reports
SIT2001 74.25MHz LVCMOS. Freq. Test Reports
坐2001 74.176MHz LVCMOS Freq. Test Reports
SIT2001 74.175824MHz LVCMOS. Freq. Test Reports
SIT2001 75MHz LVCMOS. Freq. Test Reports
坐2001 77.76MHz LVCMOS Freq. Test Reports
坐2001 100MHz LVCMOS Freq. Test Reports
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
如何测量精密定时应用中的时钟抖动 Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
如何使用Sentime的新现场编程器获得即时振荡器 Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
Silicon MEMS Oscillators Provide Benefits for LED Lighting 白皮书
MEMS Timing Solutions Improve Touchscreen Devices 白皮书
用于医疗应用的现场可编程定时解决方案 白皮书
Ultra-robust MEMS timing solutions improve performance and reliability in meter applications 白皮书
MEMS oscillators improve reliability and system performance in motor control applications 白皮书
基于MEMS的谐振器和振荡器现在更换了石英 Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
现场可编程振荡器数据表 数据表
坐2001 Datasheet 数据表
时间机器II MEMS振荡器编程器 Product Briefs
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002用于单端振荡器的终止建议,驱动单个或多个负载 Application Notes
J-AN10006仪器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
距离浮气器函数计算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028探测振荡器输出 Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
sitの MEMS First™ プロセス技術 Technology Papers
sit's MEMS First™ and EpiSeal™ Processes Technology Papers
使用振荡器而不是晶体谐振器的前8个理由 白皮书
MEMS谐振器优势 - MEMS谐振器如何工作第2部分betway开户官网 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
硅MEMS振荡器频率特性和测量技术 Presentations
坐2001 (LVCMOS, 1.8 V) Ibis模型
坐2001 (LVCMOS, 2.5 V) Ibis模型
SIT2001(LVCMOS,2.8 V) Ibis模型
Sit2001(LVCMOS,3.0 V) Ibis模型
坐2001 (LVCMOS, 3.3 V) Ibis模型
SIT2001(LVCMOS,2.25至3.63 V) Ibis模型
AN10052 IEEE 1588 ITU-T标准的精密时间协议(PTP) Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
Phase Noise Measurement Tutorial 视频
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters 视频
sitMEMS Oscillators - Revolutionizing the Timing Market 视频
SiTime第二时间机器——第1部分:如何安装Oscillator Programming Software 视频
sit's Time Machine II - Part 2: How to Program Field Programmable Oscillators 视频
Training Module: Replacing Crystals with Oscillators 视频
sot 23 5-pins 3D Step Models
SITIME MEMS定时解决方案(8.5x11) 小册子/飞行员
SITIME MEMS定时解决方案(A4) 小册子/飞行员
SITIME MEMS定时解决方案(A4)Chinese 小册子/飞行员
工业时序解决方案 小册子/飞行员
硅替换石英(日本字幕) 视频
Silicon Replaces Quartz (Chinese Subtitles) 视频
sitMEMS First 工艺 Technology Papers
AN10073如何设置实时示波器以测量抖动 Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070计算领带的非电信应用领带因素 Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes