SIT2024BA-S2-33E-40.000000GydF4y2Ba

数据表GydF4y2Ba
Leaded SOT23 package for best board-level reliability, inspection, and manufacturability

SIT2024BA-S2-33E-40.000000GydF4y2Ba

设备类型GydF4y2Ba 汽车和高温振荡器GydF4y2Ba
Frequency
40 MHz
频率稳定性（PPM）GydF4y2Ba
25
操作温度。范围（°C）GydF4y2Ba
-40 to 125
输出类型GydF4y2Ba
LVCMOS
电源电压（V）GydF4y2Ba
3.30
Package Size (mm x mm)
SOT23 (2.9x2.8)
Package Height (mm)
1.45GydF4y2Ba
Output Drive Strength*
Default
Feature Pin
Output Enable
Pull Range (PPM PR)
n/a
传播百分比GydF4y2Ba
n/a
摆动选择GydF4y2Ba
n/a
DC-Coupled Output VOL or AC Swing
n/a
直流耦合输出vohGydF4y2Ba
n/a
rohs.GydF4y2Ba
Yes

*有关详细信息，请参阅数据表GydF4y2Ba

磁带和卷轴选项GydF4y2Ba

D = 3,000 ct
E = 1,000
G = 250 ct
  • Leaded SOT23 package for best board-level reliability, inspection, and manufacturability
    放大GydF4y2Ba

    Leaded SOT23 package for best board-level reliability, inspection, and manufacturability

独特的组合GydF4y2Ba

  • ±20 ppm
  • -55至125°C温度范围GydF4y2Ba
  • SOT23-5包：GydF4y2Ba
    • 全极其温度范围内的最佳稳定性，适用于汽车和高密钥应用GydF4y2Ba

0.1 ppb /GydF4y2BaGGydF4y2BalowGGydF4y2Ba-sensitivity

  • 恶劣环境中没有性能下降GydF4y2Ba

70GGydF4y2Bavibration and 10,000GGydF4y2Ba震惊GydF4y2Ba

  • Indestructible

Configurable rise/fall time

  • Optimize EMI to reduce interference to other subsystems

SOT23-5 package

  • 最佳板级焊点可靠性GydF4y2Ba
  • 简单，低成本，光学，电路板级检查焊点GydF4y2Ba

超快速的交换时间（4至6周）GydF4y2Ba

  • 减少库存开销GydF4y2Ba
  • Mitigate shortage risks
  • Engine & transmission ECUs
  • XTAL replacement
  • ADAS computer
  • Automotive cameras
  • Infotainment
  • 发动机和动力系GydF4y2Ba
  • Defense & aerospace

狭窄：GydF4y2Ba

文档名称GydF4y2Ba Type
5L-SOT23 Package Composition Report Composition Reports
Electronics Industry Citizen Coalition Template 其他优质文件GydF4y2Ba
Manufacturing Notes for SiTime Products 其他优质文件GydF4y2Ba
SiTime Conflict Metal Declaration 其他优质文件GydF4y2Ba
SiTime Environmental Policy 其他优质文件GydF4y2Ba
日期代码的境内保修GydF4y2Ba 其他优质文件GydF4y2Ba
ISO9001:2015 Certificate of Registration 其他优质文件GydF4y2Ba
冲突矿物报告模板GydF4y2Ba 其他优质文件GydF4y2Ba
5L-SOT23封装资格报告 - CAREMGydF4y2Ba 可靠性报告GydF4y2Ba
距离振荡器可靠性报告（0.18微米CMOS工艺产品）GydF4y2Ba 可靠性报告GydF4y2Ba
SiT16XX, SiT89XX High Temp Product Qualification Report 可靠性报告GydF4y2Ba
SOT23包UTAC可靠性报告GydF4y2Ba 可靠性报告GydF4y2Ba
TSMC Wafer SGS Report RoHS / REACH / Green证书GydF4y2Ba
Tower Jazz Wafer SGS Report RoHS / REACH / Green证书GydF4y2Ba
5L-SOT23 Package Homogeneous Materials and SGS Report – Carsem RoHS / REACH / Green证书GydF4y2Ba
BOSCH Wafer SGS Report RoHS / REACH / Green证书GydF4y2Ba
WLCSP封装均质材料和SGS报告GydF4y2Ba RoHS / REACH / Green证书GydF4y2Ba
SiTime Environmental Compliance Declaration RoHS / REACH / Green证书GydF4y2Ba
合规证书 - 欧盟RoHS宣言GydF4y2Ba RoHS / REACH / Green证书GydF4y2Ba
5L-SOT23 Package Homogeneous Materials and SGS Report - UTAC RoHS / REACH / Green证书GydF4y2Ba

Evaluation Board（GydF4y2Ba联系Silime.GydF4y2Ba）GydF4y2Ba– SiT6097 (2928 SOT23-5)

Time Machine II Programmer– Program frequency, voltage, stability & more

Frequency Slope (dF/dT) Calculator– Calculate frequency slope over temperature

Reliability Calculator– Get FIT/MTBF data for various operating conditions

SOT 23 5-Pins3D Step Model– Preview oscillator packages in 3D

狭窄：GydF4y2Ba

资源名称GydF4y2Ba Type
SIT2024.7.3728MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 8.192MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.8MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.9.8304MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 9.84375MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024 11.0592MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024 12.288MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.12MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 13.52127MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.13.225625MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 13MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024 14.7456MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.14.31818MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.15MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.16.384MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.16MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.18.432MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.19.6608MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 20MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.22.1184MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.24.56MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 24.576MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.24MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.25MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 26MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.27MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.29.4912MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.30MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 32MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.33MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.36MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 40MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.48MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.50MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 54MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.60MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.62.5MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 65MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.66MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 72MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.74.25MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.74.176MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024 74.175824MHz LVCMOS.GydF4y2Ba 弗里克。测试报告GydF4y2Ba
SIT2024.75MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.77.76MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024.100MHz LVCMOS 弗里克。测试报告GydF4y2Ba
SIT2024（LVCMOS，1.8 V）GydF4y2Ba IBIS Models
SIT2024.（LVCMOS, 2.5 V) IBIS Models
SIT2024.（LVCMOS, 2.8 V) IBIS Models
SIT2024.（LVCMOS, 3.0 V) IBIS Models
SIT2024.（LVCMOS, 3.3 V) IBIS Models
SIT2024.（LVCMOS, 2.25 to 3.63 V) IBIS Models
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SIT2024B Datasheet.GydF4y2Ba 数据表s
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AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads 申请笔记GydF4y2Ba
J-AN10006 発振器のPCBデザインのガイドライン 申请笔记GydF4y2Ba
AN10006最佳设计和布局实践GydF4y2Ba 申请笔记GydF4y2Ba
AN10007 Clock Jitter Definitions and Measurement Methods 申请笔记GydF4y2Ba
J-AN10007 クロックジッタの定義と測定方法 申请笔记GydF4y2Ba
SiTime発振器の信頼性計算方法 Technology Papers
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J-AN10028プローブプローブ使使使しししたのの波形波形计测方法GydF4y2Ba 申请笔记GydF4y2Ba
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基于MEMS和石英振荡器的电磁敏感性比较GydF4y2Ba Technology Papers
MEMS発振器材と水晶仪器のの比较（耐冲撃と移动）GydF4y2Ba Technology Papers
基于MEMS和石英振荡器的冲击和振动比较GydF4y2Ba Technology Papers
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Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SITIMEのMEMS FIRST™プロセス技术GydF4y2Ba Technology Papers
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SiTime MEMS First 工艺 Technology Papers
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AN10072 Determine the Dominant Source of Phase Noise, by Inspection 申请笔记GydF4y2Ba
AN10074从RMS抖动测量中移除示波器噪声GydF4y2Ba 申请笔记GydF4y2Ba

订阅新闻和更新GydF4y2Ba