年代iT2024BA-S2-XXE-40.000000

年代iT2024BA-S2-XXE-40.000000

Device Type Automotive & High Temp Oscillators
Frequency
40 MHz
Frequency Stability (ppm)
25
Operating Temp. Range (°C)
-40 to 125
Output Type
LVCMOS
年代upply Voltage (V)
2.25 to 3.63
Package Size (mm x mm)
年代OT23 (2.9x2.8)
Package Height (mm)
1.45
Output Drive Strength*
Default
Feature Pin
Output Enable
Pull Range (PPM PR)
n/a
年代pread Percentage
n/a
年代wing Select
n/a
DC-Coupled Output VOL or AC Swing
n/a
DC-Coupled Output VOH
n/a
RoHS
Yes

*See datasheet for details

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Tape & Reel Options
G = 250 ct

Unique combination of

  • ±20 ppm
  • -55 to 125 °C temperature range
  • 年代OT23-5 package:
    • Best-in-class stability over extreme temperature range ideal for automotive and high-rel applications

0.1 ppb/glowg-sensitivity

  • No performance degradation in harsh environments

70gvibration and 10,000gshock

  • Indestructible

Configurable rise/fall time

  • Optimize EMI to reduce interference to other subsystems

年代OT23-5 package

  • Best board-level solder joint reliability
  • Easy, low-cost, optical-only, board-level inspection of solder joints

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • Mitigate shortage risks
  • Engine & transmission ECUs
  • XTAL replacement
  • ADAS computer
  • Automotive cameras
  • Infotainment
  • Engine & powertrain
  • Defense & aerospace

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Evaluation Board(Contact SiTime)– SiT6097 (2928 SOT23-5)

Time Machine II Programmer– Program frequency, voltage, stability & more

Frequency Slope (dF/dT) Calculator– Calculate frequency slope over temperature

Reliability Calculator– Get FIT/MTBF data for various operating conditions

年代OT 23 5-Pins3D Step Model– Preview oscillator packages in 3D

Narrow By:

Resource Name Type
年代iT2024 7.3728MHz LVCMOS Freq. Test Reports
年代iT2024 8.192MHz LVCMOS Freq. Test Reports
年代iT2024 8MHz LVCMOS Freq. Test Reports
年代iT2024 9.8304MHz LVCMOS Freq. Test Reports
年代iT2024 9.84375MHz LVCMOS Freq. Test Reports
年代iT2024 11.0592MHz LVCMOS Freq. Test Reports
年代iT2024 12.288MHz LVCMOS Freq. Test Reports
年代iT2024 12MHz LVCMOS Freq. Test Reports
年代iT2024 13.52127MHz LVCMOS Freq. Test Reports
年代iT2024 13.225625MHz LVCMOS Freq. Test Reports
年代iT2024 13MHz LVCMOS Freq. Test Reports
年代iT2024 14.7456MHz LVCMOS Freq. Test Reports
年代iT2024 14.31818MHz LVCMOS Freq. Test Reports
年代iT2024 15MHz LVCMOS Freq. Test Reports
年代iT2024 16.384MHz LVCMOS Freq. Test Reports
年代iT2024 16MHz LVCMOS Freq. Test Reports
年代iT2024 18.432MHz LVCMOS Freq. Test Reports
年代iT2024 19.6608MHz LVCMOS Freq. Test Reports
年代iT2024 20MHz LVCMOS Freq. Test Reports
年代iT2024 22.1184MHz LVCMOS Freq. Test Reports
年代iT2024 24.56MHz LVCMOS Freq. Test Reports
年代iT2024 24.576MHz LVCMOS Freq. Test Reports
年代iT2024 24MHz LVCMOS Freq. Test Reports
年代iT2024 25MHz LVCMOS Freq. Test Reports
年代iT2024 26MHz LVCMOS Freq. Test Reports
年代iT2024 27MHz LVCMOS Freq. Test Reports
年代iT2024 29.4912MHz LVCMOS Freq. Test Reports
年代iT2024 30MHz LVCMOS Freq. Test Reports
年代iT2024 32MHz LVCMOS Freq. Test Reports
年代iT2024 33MHz LVCMOS Freq. Test Reports
年代iT2024 36MHz LVCMOS Freq. Test Reports
年代iT2024 40MHz LVCMOS Freq. Test Reports
年代iT2024 48MHz LVCMOS Freq. Test Reports
年代iT2024 50MHz LVCMOS Freq. Test Reports
年代iT2024 54MHz LVCMOS Freq. Test Reports
年代iT2024 60MHz LVCMOS Freq. Test Reports
年代iT2024 62.5MHz LVCMOS Freq. Test Reports
年代iT2024 65MHz LVCMOS Freq. Test Reports
年代iT2024 66MHz LVCMOS Freq. Test Reports
年代iT2024 72MHz LVCMOS Freq. Test Reports
年代iT2024 74.25MHz LVCMOS Freq. Test Reports
年代iT2024 74.176MHz LVCMOS Freq. Test Reports
年代iT2024 74.175824MHz LVCMOS Freq. Test Reports
年代iT2024 75MHz LVCMOS Freq. Test Reports
年代iT2024 77.76MHz LVCMOS Freq. Test Reports
年代iT2024 100MHz LVCMOS Freq. Test Reports
年代iT2024 (LVCMOS, 1.8 V) IBIS Models
年代iT2024 (LVCMOS, 2.5 V) IBIS Models
年代iT2024 (LVCMOS, 2.8 V) IBIS Models
年代iT2024 (LVCMOS, 3.0 V) IBIS Models
年代iT2024 (LVCMOS, 3.3 V) IBIS Models
年代iT2024 (LVCMOS, 2.25 to 3.63 V) IBIS Models
年代ilicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
MEMS Oscillators Enhance Clock Performance in Industrial and Hi-Reliability Applications Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
How to Get Instant Oscillators with SiTime's New Field Programmer Presentations
年代ilicon MEMS vs Quartz Supply Chain Presentations
Increase automotive reliability and performance with ultra robust MEMS oscillators White Papers
Field Programmable Timing Solutions for Medical Applications White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
Field Programmable Oscillators Datasheet Datasheets
年代iT2024B Datasheet Datasheets
Time Machine II MEMS Oscillator Programmer Product Briefs
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
年代iTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
年代hock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
年代iTimeの MEMS First™ プロセス技術 Technology Papers
年代iTime's MEMS First™ and EpiSeal™ Processes Technology Papers
The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
年代ilicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
年代C-AN10007 时钟抖动定义与测量方法 Application Notes
年代C-AN10033 振荡器频率测量指南 Application Notes
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
Phase Noise Measurement Tutorial Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters Videos
年代iTime MEMS Oscillators - Revolutionizing the Timing Market Videos
年代iTime's Time Machine II - Part 1: How to Install Oscillator Programming Software Videos
年代iTime's Time Machine II - Part 2: How to Program Field Programmable Oscillators Videos
年代OT 23 5-Pins 3D Step Models
AEC-Q100 Automotive Oscillators Product Briefs
Timing Solutions for Automotive Systems Brochures/Fliers
年代iTime MEMS Timing Solutions (8.5x11) Brochures/Fliers
年代iTime MEMS Timing Solutions (A4) Brochures/Fliers
年代iTime MEMS Timing Solutions (A4) Chinese Brochures/Fliers
年代ilicon Replaces Quartz (Japanese Subtitles) Videos
年代ilicon Replaces Quartz (Chinese Subtitles) Videos
年代iTime MEMS First 工艺 Technology Papers
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes