坐5021AI-2BE-33E-48.004800

Datasheet
行业standard packages as small as 2.5 x 2.0 mm for all frequencies, voltages, and stabilities

坐5021AI-2BE-33E-48.004800

Device Type TCXOs
频率
48.0048 MHz
频率Stability (ppm)
5
Operating Temp. Range (°C)
-40 to 85
Output Type
LVDS
Supply Voltage (V)
3.30
封装尺寸（mm x mm）
3.2x2.5
Package Height (mm)
0.75
输出驱动强度*
Default
特征PIN.
OE.
拉伸范围（PPM PR）
No Pull
Spread Percentage
n/a
Swing Select
n/a
直流耦合输出Vol或AC Swing
n/a
DC-Coupled Output VOH
n/a
RoHS
是的

*See datasheet for details

Tape & Reel Options

T = 3,000 ct
X = 1,500 ct
Y = 250 ct
  • 行业standard packages as small as 2.5 x 2.0 mm for all frequencies, voltages, and stabilities
    enlarge

    行业standard packages as small as 2.5 x 2.0 mm for all frequencies, voltages, and stabilities

频率稳定性±5 ppm

  • 更好的时序余量，可提高系统稳定性和鲁棒性

广泛的可编程性

  • 频率from 1 to 220 MHz
  • LVPECL and LVDS output signaling types
  • 电源电压为2.5V和3.3V
  • 频率稳定性±5 ppm:
  • 定制规范，以获得最佳系统性能
  • 操作范围内的任何设备规范的可轻松可用性;

三个行业标准包

  • 100% drop-in replacement for quartz, SAW and overtone oscillators without any design changes;

4 to 6 weeks lead time

  • Reduce inventory overhead
  • Mitigate shortage risks

  • PCIE.
  • 10G Ethernet
  • 光纤通道
  • System clocking

Narrow By:

Document Name Type
4L / 6L-QFN封装成分报告（SIT820X，SIT912x，SIT50xx，SIT380x，SIT392x） 组成报告
Electronics Industry Citizen Coalition Template Other Quality Documents
SINTIME产品的制造票据 Other Quality Documents
环境冲突金属宣言 Other Quality Documents
sitEnvironmental Policy Other Quality Documents
sitWarranty on Date Code Other Quality Documents
ISO9001：2015注册证书 Other Quality Documents
Conflict Minerals Reporting Template Other Quality Documents
sitOscillator Reliability Report (0.18 micron CMOS process products) Reliability Reports
6L-QFN包装资格报告 - Carem Reliability Reports
SIT912x产品资格报告 Reliability Reports
4L / 6L-QFN非暴露垫包装资格报告 - UTAC Reliability Reports
TSMC晶圆SGS报告 RoHS/Reach/Green Certificates
塔爵士晶圆SGS报告 RoHS/Reach/Green Certificates
4L/6L-QFN Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
博世晶圆SGS报告 RoHS/Reach/Green Certificates
WLCSP Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
环境合规声明 RoHS/Reach/Green Certificates
Certificate of Compliance-EU RoHS Declaration RoHS/Reach/Green Certificates

Evaluation Boards (Contact SiTime)- SIT6097（3225）|SIT6086（5032）|SIT6085（7050）

Reliability Calculator- 获取各种操作条件的适合/ MTBF数据

频率斜率（DF / DT）计算器– Calculate frequency slope over temperature

QFN 3225 6-Pins|QFN 5032 6-Pins|QFN 7050 6-Pins– Preview packages with QFN3D步骤模型

Narrow By:

Resource Name Type
坐5021 (LVDS, 2.5 V) IBIS Models
SIT5021（LVDS，3.3 V） IBIS Models
Silicon MEMS Reliability and Resilience Presentations
性能比较：硅MEMS经验石英振荡器 Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
MEMS oscillators improve reliability and system performance in motor control applications 白皮书
基于MEMS的谐振器和振荡器现在更换了石英 Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
sit5021数据表 Datasheets
J-AN10006仪器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007时钟抖动定义和测量方法 Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
距离浮气器函数计算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較（耐衝撃と耐振動） Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033仪器の周波数量ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
J-AN10039 TCXOの周波数安定性および周波数精度バジェット Application Notes
AN10039 TCXO Frequency Stability and Frequency Accuracy Budget Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
sitの MEMS First™ プロセス技術 Technology Papers
sit's MEMS First™ and EpiSeal™ Processes Technology Papers
MEMS谐振器优势 - MEMS谐振器如何工作第2部分betway开户官网 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
硅MEMS振荡器频率特性和测量技术 Presentations
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
AN10029 Output Terminations for Differential Oscillators Application Notes
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
Timing Solutions for Communications & Enterprise 小册子/飞行员
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
Phase Noise Measurement Tutorial Videos
振荡振荡器演示 Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters Videos
sitMEMS Oscillators - Revolutionizing the Timing Market Videos
QFN 3225 6-Pins 3D Step Models
QFN 5032 6-Pins 3D Step Models
QFN 7050 6-Pins 3D Step Models
SITIME MEMS定时解决方案（8.5x11） 小册子/飞行员
sitMEMS Timing Solutions (A4) 小册子/飞行员
sitMEMS Timing Solutions (A4) Chinese 小册子/飞行员
Sentime Mems First工人 Technology Papers
AN10073如何设置实时示波器以测量抖动 Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes

Subscribe to news and updates