坐5021AI-2DE-33N-156.250000

Device Type tcxos.
Frequency
156.25 MHz
Frequency Stability (ppm)
5
Operating Temp. Range (°C)
-40 to 85
Output Type
lvds.
电源电压(V)
3.30
Package Size (mm x mm)
7.0x5.0
包装高度(mm)
0.90
Output Drive Strength*
Default
Feature Pin
No Connect
Pull Range (PPM PR)
No Pull
传播百分比
N / A.
Swing Select
N / A.
DC-Coupled Output VOL or AC Swing
N / A.
DC-Coupled Output VOH
N / A.
RoHS
Yes

*See datasheet for details

Tape & Reel Options

T = 3,000 ct
X = 1,500 ct
Y = 250 CT

Frequency stability ±5 ppm

  • Better timing margin that enhances system stability and robustness

Extensive programmability

  • Frequency from 1 to 220 MHz
  • LVPECL and LVDS output signaling types
  • Supply voltage of 2.5V and 3.3V
  • 频率稳定性±5 ppm:
  • Customized specifications for optimal system performance
  • Easy availability of any device specification within the operating range;

Three industry-standard packages

  • 100% drop-in replacement for quartz, SAW and overtone oscillators without any design changes;

4 to 6 weeks lead time

  • Reduce inventory overhead
  • 减轻短缺风险

  • PCIe
  • 10g以太网
  • Fibre channel
  • System clocking

Narrow By:

评估板(Contact SiTime)– SiT6097 (3225) | SiT6086 (5032) | SiT6085 (7050)

可靠性计算器– Get FIT/MTBF data for various operating conditions

Frequency Slope (dF/dT) Calculator- 计算频率斜率超过温度

QFN 3225 6-Pins|qfn 5032 6-pins|QFN 7050 6-Pins– Preview packages with QFN3D step models

Narrow By:

Resource Name 类型
坐5021 (LVDS, 2.5 V) IBIS Models
坐5021 (LVDS, 3.3 V) IBIS Models
Silicon MEMS Reliability and Resilience 介绍
Performance Comparison: Silicon MEMS Verses Quartz Oscillators 介绍
How to Measure Clock Jitter in Precision Timing Applications 介绍
如何测量精密定时应用中的相位抖动和相位噪声 介绍
Silicon Mems VS石英供应链 介绍
MEMS振荡器在电机控制应用中提高可靠性和系统性能 White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz 介绍
与MEMS联系:机电接口 介绍
坐5021 Datasheet 数据表
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007时钟抖动定义和测量方法 Application Notes
J-AN10007クロックジッタクロックジッタの定义と方法 Application Notes
sit発振器の信頼性計算方法 技术论文
AN10025恒化振荡器的可靠性计算 Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振の电阻场感受率の比较 技术论文
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators 技术论文
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) 技术论文
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators 技术论文
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033振荡器频率测量指南 Application Notes
J-AN10039 TCXOの周波数安定性および周波数精度バジェット Application Notes
AN10039 TCXO Frequency Stability and Frequency Accuracy Budget Application Notes
シリコンMEMS発振器材のおよび函数性 技术论文
硅MEMS振荡器的弹性和可靠性 技术论文
sitの MEMS First™ プロセス技術 技术论文
sit's MEMS First™ and EpiSeal™ Processes 技术论文
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 介绍
如何测量精密定时应用中的长期抖动和周期到循环抖动 介绍
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques 介绍
AN10052 IEEE 1588 Precision Time Protocol (PTP) in ITU-T Standards Application Notes
AN10029 Output Terminations for Differential Oscillators Application Notes
SC-AN10007时动词定义与送量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
Timing Solutions for Communications & Enterprise Brochures/Fliers
AN10062 Phase Noise Measurement Guide for Oscillators Application Notes
相位噪声测量教程 视频
Whack an Oscillator Demo 视频
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer 介绍
MEMS时序的优点 - 参数 视频
sitMEMS Oscillators - Revolutionizing the Timing Market 视频
QFN 3225 6-Pins 3D Step Models
qfn 5032 6-pins 3D Step Models
QFN 7050 6-Pins 3D Step Models
sitMEMS Timing Solutions (8.5x11) Brochures/Fliers
SITIME MEMS定时解决方案(A4) Brochures/Fliers
Sentime MEMS时序解决方案(A4)中文 Brochures/Fliers
sitMEMS First 工艺 技术论文
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072通过检查确定相位噪声的主导来源 Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes