SiT8918BA-11-33N-25.000000

SiT8918BA-11-33N-25.000000

Device Type 汽车和高温振荡器
Frequency
25 MHz
Frequency Stability (ppm)
20
Operating Temp. Range (°C)
-40 to 125
Output Type
LVCMOS
电源电压(V)
3.30
Package Size (mm x mm)
2.5x2.0
Package Height (mm)
0.75
Output Drive Strength*
Default
Feature Pin
No Connect
Pull Range (PPM PR)
n/a
传播百分比
n/a
Swing Select
n/a
DC-Coupled Output VOL or AC Swing
n/a
DC-Coupled Output VOH
n/a
RoHS
Yes

*See datasheet for details

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Tape & Reel Options
D = 3,000 ct
E = 1,000
G = 250 ct

Unique combination of

  • ±20 ppm
  • automotive temp. (-40 to 125 °C)
  • smallest package (2.0 x 1.6 mmxmm):
    • Better timing margin ideal for space-constrained, outdoor and high-temp. operating environment

0.1 ppb/glow vibration sensitivity

  • Improved system performance under vibration
  • Simpler carrier drop-test compliance (STB, etc.)

70gvibration and 50,000gshock

  • Best system reliability in harsh environments

FlexEdge™ drive strength

  • Slower rise/fall time that minimizes EMI from the oscillator
  • Lower cost by driving multiple loads and eliminate additional timing components

5 industry-standard packages

  • 100% drop-in replacement of quartz XO

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • 减轻短缺风险

  • Engine & transmission ECUs
  • XTAL replacement
  • ADAS computer
  • Automotive cameras
  • Infotainment
  • Precision GNSS
  • GPS/GNSS modules
  • 电力和能源

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Resource Name Type
SiT891819.6608MHz LVCMOS Freq. Test Reports
SiT891824MHz LVCMOS Freq. Test Reports
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SiT89188MHz LVCMOS Freq. Test Reports
SiT89189.8304MHz LVCMOS Freq. Test Reports
SiT89189.84375MHz LVCMOS Freq. Test Reports
SiT891811.0592MHz LVCMOS Freq. Test Reports
SiT891812.288MHz LVCMOS Freq. Test Reports
SIT8918 12MHz LVCMOS. Freq. Test Reports
SiT891813.52127MHz LVCMOS Freq. Test Reports
SIT8918 13.225625MHz LVCMOS. Freq. Test Reports
SiT891813MHz LVCMOS Freq. Test Reports
SiT891814.7456MHz LVCMOS Freq. Test Reports
SiT891814.31818MHz LVCMOS Freq. Test Reports
SiT891815MHz LVCMOS Freq. Test Reports
SiT891816.384MHz LVCMOS Freq. Test Reports
SiT891816MHz LVCMOS Freq. Test Reports
SiT891818.432MHz LVCMOS Freq. Test Reports
SiT891820MHz LVCMOS Freq. Test Reports
SiT891822.1184MHz LVCMOS Freq. Test Reports
SiT891824.56MHz LVCMOS Freq. Test Reports
SIT8918 25MHz LVCMOS. Freq. Test Reports
SiT891826MHz LVCMOS Freq. Test Reports
SiT891827MHz LVCMOS Freq. Test Reports
SiT891829.4912MHz LVCMOS Freq. Test Reports
SiT891830MHz LVCMOS Freq. Test Reports
SiT891832MHz LVCMOS Freq. Test Reports
SiT891833MHz LVCMOS Freq. Test Reports
SiT891836MHz LVCMOS Freq. Test Reports
SiT891840MHz LVCMOS Freq. Test Reports
SiT891848MHz LVCMOS Freq. Test Reports
SiT891850MHz LVCMOS Freq. Test Reports
SiT891854MHz LVCMOS Freq. Test Reports
SiT891860MHz LVCMOS Freq. Test Reports
SiT891862.5MHz LVCMOS Freq. Test Reports
SiT891865MHz LVCMOS Freq. Test Reports
SiT891866MHz LVCMOS Freq. Test Reports
SiT891872MHz LVCMOS Freq. Test Reports
SiT891874.25MHz LVCMOS Freq. Test Reports
SiT891874.176MHz LVCMOS Freq. Test Reports
SiT891874.175824MHz LVCMOS Freq. Test Reports
SiT891875MHz LVCMOS Freq. Test Reports
SiT891877.76MHz LVCMOS Freq. Test Reports
SiT8918100MHz LVCMOS Freq. Test Reports
SiT8918(LVCMOS, 1.8 V) IBIS Models
SiT8918(LVCMOS, 2.5 V) IBIS Models
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SiT8918(LVCMOS, 3.0 V) IBIS Models
SiT8918(LVCMOS, 3.3 V) IBIS Models
SiT8918(LVCMOS, 2.25 to 3.63 V) IBIS Models
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SiT8918Datasheet 数据表
时间机器II MEMS振荡器编程器 Product Briefs
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
坐ime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
坐imeの MEMS First™ プロセス技術 Technology Papers
坐ime's MEMS First™ and EpiSeal™ Processes Technology Papers
The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
Phase Noise Measurement Tutorial Videos
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters Videos
坐ime MEMS Oscillators - Revolutionizing the Timing Market Videos
坐ime's Time Machine II - Part 1: How to Install Oscillator Programming Software Videos
坐ime's Time Machine II - Part 2: How to Program Field Programmable Oscillators Videos
QFN 2016 4-Pins 3D Step Models
QFN 2520 4-Pins 3D Step Models
QFN 3225 4-Pins 3D Step Models
QFN 5032 4-Pins 3D Step Models
QFN 7050 4-Pins 3D Step Models
Timing Solutions for Industrial Brochures/Fliers
坐ime MEMS First 工艺 Technology Papers
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes