SiT8918BA-13-25E-50.000000

Datasheet
Five industry standard footprints as small as 2016 for all frequencies, voltages, and stabilities

SiT8918BA-13-25E-50.000000

Device Type 汽车& High Temp Oscillators
Frequency
50.MHz
Frequency Stability (ppm)
50.
Operating Temp. Range (°C)
-40 to 125
Output Type
lvcmos.
Supply Voltage (V)
2.50
Package Size (mm x mm)
2.5x2.0
包装高度（mm）
0.75
Output Drive Strength*
Default
Feature Pin
Output Enable
拉伸范围（PPM PR）
N / A.
Spread Percentage
N / A.
Swing Select
N / A.
DC-Coupled Output VOL or AC Swing
N / A.
DC-Coupled Output VOH
N / A.
RoHS
是的

*See datasheet for details

Buy Now

Tape & Reel Options
D = 3,000 ct
E = 1,000
g = 250 ct
  • Five industry standard footprints as small as 2016 for all frequencies, voltages, and stabilities
    enlarge

    Five industry standard footprints as small as 2016 for all frequencies, voltages, and stabilities

  • SiT8918pin assignments
    enlarge

    SiT8918pin assignments

  • SiT8918block diagram
    enlarge

    SiT8918block diagram

Unique combination of

  • ±20 ppm
  • 汽车温度。（-40至125°C）
  • smallest package (2.0 x 1.6 mmxmm):
    • 更好的时序边缘，适用于空间受限，户外和高温。操作环境

0.1 ppb/glow vibration sensitivity

  • Improved system performance under vibration
  • Simpler carrier drop-test compliance (STB, etc.)

70g振动和50,000人gshock

  • 恶劣环境中最好的系统可靠性

FlexEdge™ drive strength

  • Slower rise/fall time that minimizes EMI from the oscillator
  • Lower cost by driving multiple loads and eliminate additional timing components

5 industry-standard packages

  • 100% drop-in replacement of quartz XO

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • Mitigate shortage risks

  • Engine & transmission ECUs
  • XTAL replacement
  • ADAS computer
  • 汽车摄像头
  • 信息娱乐
  • 精密GNSS.
  • GPS / GNSS模块
  • Power & energy

Narrow By:

Document Name 类型
4L-QFN Package Composition Report (SiT160X, SiT800X, SiT1618, SiT89XX) 组成报告
电子行业公民联盟模板 Other Quality Documents
SINTIME产品的制造票据 Other Quality Documents
坐ime Conflict Metal Declaration Other Quality Documents
环境政策环境政策 Other Quality Documents
坐ime Warranty on Date Code Other Quality Documents
Conflict Minerals Reporting Template Other Quality Documents
坐ime Oscillator Reliability Report (0.18 micron CMOS process products) Reliability Reports
4L-QFN封装资格报告 - UTAC Reliability Reports
4L-QFN Package Qualification Report - ASE Reliability Reports
4L-QFN封装资格报告 - 汽车 Reliability Reports
坐16XX, SiT89XX High Temp Product Qualification Report Reliability Reports
TSMC Wafer SGS Report RoHS/Reach/Green Certificates
Tower Jazz Wafer SGS Report RoHS/Reach/Green Certificates
4L/6L-QFN Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
BOSCH Wafer SGS Report RoHS/Reach/Green Certificates
WLCSP Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
坐ime Environmental Compliance Declaration RoHS/Reach/Green Certificates
Certificate of Compliance-EU RoHS Declaration RoHS/Reach/Green Certificates

Eval Boards(Contact SiTime)–坐6095 (2016) | SiT6081 (2520) | SiT6082 (3225) | SiT6083 (5032) | SiT6084 (7050)

Frequency Slope (dF/dT) Calculator- 计算频率斜率超过温度

Time Machine II Programmer–Program frequency, voltage, stability & more

可靠性计算器–Get FIT/MTBF data for various operating conditions

2016 4-Pins|2520 4针|3225 4针|50.32 4-Pins|7050.4-Pins– Preview packages with QFN 3D step models

Narrow By:

Resource Name 类型
SIT8918 19.6608MHz LVCMOS. Freq. Test Reports
SIT8918 24MHz LVCMOS. Freq. Test Reports
SIT8918 7.3728MHz LVCMOS. Freq. Test Reports
SiT89188.192MHz LVCMOS Freq. Test Reports
SiT89188MHz LVCMOS Freq. Test Reports
SIT8918 9.8304MHz LVCMOS. Freq. Test Reports
SIT8918 9.84375MHz LVCMOS. Freq. Test Reports
SiT891811.0592MHz LVCMOS Freq. Test Reports
SiT891812.288MHz LVCMOS Freq. Test Reports
SiT891812MHz LVCMOS Freq. Test Reports
SiT891813.52127MHz LVCMOS Freq. Test Reports
SiT891813.225625MHz LVCMOS Freq. Test Reports
SIT8918 13MHz LVCMOS. Freq. Test Reports
SiT891814.7456MHz LVCMOS Freq. Test Reports
SIT8918 14.31818MHz LVCMOS. Freq. Test Reports
SiT891815MHz LVCMOS Freq. Test Reports
SIT8918 16.384MHz LVCMOS. Freq. Test Reports
SiT891816MHz LVCMOS Freq. Test Reports
SIT8918 18.432MHz LVCMOS. Freq. Test Reports
SiT891820MHz LVCMOS Freq. Test Reports
SiT891822.1184MHz LVCMOS Freq. Test Reports
SIT8918 24.56MHz LVCMOS. Freq. Test Reports
SiT891825MHz LVCMOS Freq. Test Reports
SiT891826MHz LVCMOS Freq. Test Reports
SiT891827MHz LVCMOS Freq. Test Reports
SiT891829.4912MHz LVCMOS Freq. Test Reports
SiT891830MHz LVCMOS Freq. Test Reports
SiT891832MHz LVCMOS Freq. Test Reports
SiT891833MHz LVCMOS Freq. Test Reports
SiT891836MHz LVCMOS Freq. Test Reports
SIT8918 40MHz LVCMOS. Freq. Test Reports
SiT891848MHz LVCMOS Freq. Test Reports
SIT8918 50MHz LVCMOS. Freq. Test Reports
SiT891854MHz LVCMOS Freq. Test Reports
SiT891860MHz LVCMOS Freq. Test Reports
SIT8918 62.5MHz LVCMOS. Freq. Test Reports
SIT8918 65MHz LVCMOS. Freq. Test Reports
SIT8918 66MHz LVCMOS. Freq. Test Reports
SiT891872MHz LVCMOS Freq. Test Reports
SiT891874.25MHz LVCMOS Freq. Test Reports
SiT891874.176MHz LVCMOS Freq. Test Reports
SiT891874.175824MHz LVCMOS Freq. Test Reports
SiT891875MHz LVCMOS Freq. Test Reports
SiT891877.76MHz LVCMOS Freq. Test Reports
SIT8918 100MHz LVCMOS. Freq. Test Reports
SIT8918（LVCMOS，1.8 V） IBIS Models
SIT8918（LVCMOS，2.5 V） IBIS Models
SiT8918(LVCMOS, 2.8 V) IBIS Models
SiT8918(LVCMOS, 3.0 V) IBIS Models
SiT8918(LVCMOS, 3.3 V) IBIS Models
SiT8918(LVCMOS, 2.25 to 3.63 V) IBIS Models
Silicon MEMS Reliability and Resilience 介绍
性能比较：硅MEMS经验石英振荡器 介绍
MEMS Oscillators Enhance Clock Performance in Industrial and Hi-Reliability Applications 介绍
How to Measure Clock Jitter in Precision Timing Applications 介绍
如何测量精密定时应用中的相位抖动和相位噪声 介绍
如何获得即时振荡器与SiTime新的Field Programmer 介绍
Silicon Mems VS石英供应链 介绍
提高高温，超强MEMS振荡器的工业设备的性能 White Papers
Silicon MEMS Oscillators Provide Benefits for LED Lighting White Papers
MEMS Timing Solutions Improve Touchscreen Devices White Papers
Field Programmable Timing Solutions for Medical Applications White Papers
超强鲁棒MEMS定时解决方案提高了仪表应用中的性能和可靠性 White Papers
MEMS振荡器在电机控制应用中提高可靠性和系统性能 White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz 介绍
与MEMS联系：机电接口 介绍
Field Programmable Oscillators Datasheet Datasheets
SiT8918Datasheet Datasheets
时间机器II MEMS振荡器的程序员 产品简介
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007时钟抖动定义和测量方法 Application Notes
J-AN10007クロックジッタクロックジッタの定义と方法 Application Notes
坐ime発振器の信頼性計算方法 技术论文
AN10025恒化振荡器的可靠性计算 Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振の电阻场感受率の比较 技术论文
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators 技术论文
MEMS発振器と水晶発振器の性能比較（耐衝撃と耐振動） 技术论文
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators 技术论文
J-AN10033仪器の周波数量ガイドライン Application Notes
AN10033振荡器频率测量指南 Application Notes
シリコンMEMS発振器材のおよび函数性 技术论文
硅MEMS振荡器的弹性和可靠性 技术论文
坐imeの MEMS First™ プロセス技術 技术论文
坐ime's MEMS First™ and EpiSeal™ Processes 技术论文
The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 介绍
如何测量精密定时应用中的长期抖动和周期到循环抖动 介绍
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques 介绍
SC-AN10007时动词定义与送量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
相位噪声测量教程 视频
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer 介绍
MEMS时序的优点 - 参数 视频
坐ime MEMS Oscillators - Revolutionizing the Timing Market 视频
坐ime's Time Machine II - Part 1: How to Install Oscillator Programming Software 视频
坐ime's Time Machine II - Part 2: How to Program Field Programmable Oscillators 视频
QFN 2016 4-Pins 3D Step Models
qfn 2520 4-pins 3D Step Models
QFN 3225 4-Pins 3D Step Models
qfn 5032 4-pins 3D Step Models
qfn 7050 4-pins 3D Step Models
Timing Solutions for Industrial Brochures/Fliers
Sentime Mems First工人 技术论文
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072通过检查确定相位噪声的主导来源 Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes

Subscribe to news and updates