SiT8920BM-22-33E-25.000000

SiT8920BM-22-33E-25.000000

Device Type 汽车和高温振荡器
Frequency
25 MHz
Frequency Stability (ppm)
25
Operating Temp. Range (°C)
-55 to 125
Output Type
LVCMOS
电源电压(V)
3.30
Package Size (mm x mm)
3.2x2.5
Package Height (mm)
0.75
Output Drive Strength*
Default
Feature Pin
Output Enable
Pull Range (PPM PR)
n/a
传播百分比
n/a
Swing Select
n/a
DC-Coupled Output VOL or AC Swing
n/a
DC-Coupled Output VOH
n/a
RoHS
Yes

*See datasheet for details

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Tape & Reel Options
D = 3,000 ct
E = 1,000
G = 250 ct

Configurable feature sets

  • Any frequency between 1 and 110 MHz with 6 decimal places of accuracy
  • Stability as low as ±20 ppm
  • Industrial or extended commercial temp.
  • 1.8 V or 2.5 V to 3.3 V supply voltage
  • Customize specification for optimal system performance
  • Use same base device for many designs, reducing qualification needs

Low power consumption

  • 0.6 µA typical standby current (1.8 V)
  • 3.5 mA typical active current (1.8 V)
  • Extends battery life in portable applications
  • Reduces power consumption for greener systems

FlexEdge™ configurable drive strength

  • Slower rise/fall time that minimizes EMI from the oscillator
  • Saves cost by driving multiple loads and eliminate additional timing components

Ultra-fast lead time (4 to 6 weeks)

  • Reduce inventory overhead
  • 减轻短缺风险

  • Oil exploration drilling
  • Power amplifiers
  • Industrial motors
  • Pressure meters
  • Aerospace equipment
  • Geothermal energy equipment

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Resource Name Type
SiT8920 65MHz LVCMOS Freq. Test Reports
SiT8920 32MHz LVCMOS Freq. Test Reports
SiT8920 33MHz LVCMOS Freq. Test Reports
SiT8920 36MHz LVCMOS Freq. Test Reports
SIT8920 40MHz LVCMOS. Freq. Test Reports
SiT8920 48MHz LVCMOS Freq. Test Reports
SiT8920 50MHz LVCMOS Freq. Test Reports
SiT8920 54MHz LVCMOS Freq. Test Reports
SiT8920 60MHz LVCMOS Freq. Test Reports
SiT8920 62.5 mhz LVCMOS Freq. Test Reports
SIT8920 66MHz LVCMOS. Freq. Test Reports
SiT8920 72MHz LVCMOS Freq. Test Reports
SiT8920 74.25MHz LVCMOS Freq. Test Reports
SiT8920 74.176MHz LVCMOS Freq. Test Reports
SiT8920 74.175824MHz LVCMOS Freq. Test Reports
SiT8920 75MHz LVCMOS Freq. Test Reports
SiT8920 77.76MHz LVCMOS Freq. Test Reports
SiT8920 100MHz LVCMOS Freq. Test Reports
SiT8920 7.3728MHz LVCMOS Freq. Test Reports
SiT8920 8.192MHz LVCMOS Freq. Test Reports
SiT8920 8MHz LVCMOS Freq. Test Reports
SiT8920 9.8304MHz LVCMOS Freq. Test Reports
SiT8920 9.84375MHz LVCMOS Freq. Test Reports
SiT8920 11.0592MHz LVCMOS Freq. Test Reports
SiT8920 12.288MHz LVCMOS Freq. Test Reports
SiT8920 12MHz LVCMOS Freq. Test Reports
SiT8920 13.52127MHz LVCMOS Freq. Test Reports
SiT8920 13.225625MHz LVCMOS Freq. Test Reports
SiT8920 13MHz LVCMOS Freq. Test Reports
SiT8920 14.7456 mhz LVCMOS Freq. Test Reports
SiT8920 14.31818MHz LVCMOS Freq. Test Reports
SiT8920 15MHz LVCMOS Freq. Test Reports
SiT8920 16.384MHz LVCMOS Freq. Test Reports
SiT8920 16MHz LVCMOS Freq. Test Reports
SiT8920 18.432MHz LVCMOS Freq. Test Reports
SiT8920 19.6608MHz LVCMOS Freq. Test Reports
SiT8920 20MHz LVCMOS Freq. Test Reports
SiT8920 22.1184MHz LVCMOS Freq. Test Reports
SiT8920 24.56MHz LVCMOS Freq. Test Reports
SiT8920 24.576MHz LVCMOS Freq. Test Reports
SiT8920 24MHz LVCMOS Freq. Test Reports
SIT8920 25MHz LVCMOS. Freq. Test Reports
SIT8920 26MHz LVCMOS. Freq. Test Reports
SiT8920 27MHz LVCMOS Freq. Test Reports
SiT8920 29.4912MHz LVCMOS Freq. Test Reports
SiT8920 30MHz LVCMOS Freq. Test Reports
SiT8920 (LVCMOS, 1.8 V) IBIS Models
SiT8920 (LVCMOS, 2.5 V) IBIS Models
SiT8920 (LVCMOS, 1.8 V) IBIS Models
SiT8920 (LVCMOS, 2.5 V) IBIS Models
SiT8920 (LVCMOS, 2.8 V) IBIS Models
SiT8920 (LVCMOS, 3.0 V) IBIS Models
SiT8920 (LVCMOS, 3.3 V) IBIS Models
SiT8920 (LVCMOS, 2.25 to 3.63 V) IBIS Models
Silicon MEMS Reliability and Resilience Presentations
Performance Comparison: Silicon MEMS Verses Quartz Oscillators Presentations
MEMS Oscillators Enhance Clock Performance in Industrial and Hi-Reliability Applications Presentations
How to Measure Clock Jitter in Precision Timing Applications Presentations
How to Measure Phase Jitter and Phase Noise in Precision Timing Applications Presentations
How to Get Instant Oscillators with SiTime's New Field Programmer Presentations
Silicon MEMS vs Quartz Supply Chain Presentations
Enhance Performance of Industrial Equipment with High-temperature, Ultra Robust MEMS Oscillators White Papers
Silicon MEMS Oscillators Provide Benefits for LED Lighting White Papers
MEMS Timing Solutions Improve Touchscreen Devices White Papers
Field Programmable Timing Solutions for Medical Applications White Papers
Ultra-robust MEMS timing solutions improve performance and reliability in meter applications White Papers
MEMS oscillators improve reliability and system performance in motor control applications White Papers
MEMS-Based Resonators and Oscillators are Now Replacing Quartz Presentations
Getting In Touch with MEMS: The Electromechanical Interface Presentations
Field Programmable Oscillators Datasheet 数据表
SiT8920 Datasheet 数据表
时间机器II MEMS振荡器编程器 Product Briefs
J-AN10002 シングルエンド発振器の推奨終端方法 Application Notes
AN10002 Termination Recommendations for Single-ended Oscillator Driving Single or Multiple Loads Application Notes
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10006 Best Design and Layout Practices Application Notes
AN10007 Clock Jitter Definitions and Measurement Methods Application Notes
J-AN10007 クロックジッタの定義と測定方法 Application Notes
SiTime発振器の信頼性計算方法 Technology Papers
AN10025 Reliability Calculations for SiTime Oscillators Application Notes
J-AN10028 プローブを使用した発振器の出力波形計測方法 Application Notes
AN10028 Probing Oscillator Output Application Notes
MEMSおよび水晶ベース発振器の電磁場感受率の比較 Technology Papers
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators Technology Papers
MEMS発振器と水晶発振器の性能比較(耐衝撃と耐振動) Technology Papers
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators Technology Papers
J-AN10033 発振器の周波数測定ガイドライン Application Notes
AN10033 Frequency Measurement Guidelines for Oscillators Application Notes
シリコンMEMS発振器の耐性および信頼性 Technology Papers
Resilience and Reliability of Silicon MEMS Oscillators Technology Papers
SiTimeの MEMS First™ プロセス技術 Technology Papers
SiTime's MEMS First™ and EpiSeal™ Processes Technology Papers
The top 8 reasons to use an oscillator instead of a crystal resonator White Papers
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 Presentations
How to Measure Long-term Jitter and Cycle-to-cycle Jitter in Precision Timing Applications Presentations
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques Presentations
SC-AN10007 时钟抖动定义与测量方法 Application Notes
SC-AN10033 振荡器频率测量指南 Application Notes
Phase Noise Measurement Tutorial 视频
PCI Express Refclk Jitter Compliance using a Phase Noise Analyzer Presentations
Advantages of MEMS Timing - Parameters 视频
SiTime MEMS Oscillators - Revolutionizing the Timing Market 视频
SiTime's Time Machine II - Part 1: How to Install Oscillator Programming Software 视频
SiTime's Time Machine II - Part 2: How to Program Field Programmable Oscillators 视频
QFN 2016 4-Pins 3D Step Models
QFN 2520 4-Pins 3D Step Models
QFN 3225 4-Pins 3D Step Models
QFN 5032 4-Pins 3D Step Models
QFN 7050 4-Pins 3D Step Models
Timing Solutions for Industrial Brochures/Fliers
SiTime MEMS First 工艺 Technology Papers
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
AN10071 Computing TIE Crest Factors for Telecom Applications Application Notes
AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
AN10072 Determine the Dominant Source of Phase Noise, by Inspection Application Notes
AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes