SiT9365型AC-2B1-33E125.000000

Datasheet
小型工业标准封装使小型系统具有严格的抖动要求

SiT9365型AC-2B1-33E125.000000

Device Type 微分振荡器
频率
125 MHz
频率Stability (ppm)
20
Operating Temp. Range (°C)
-20至70
Output Type
lvds.
电源电压（V）
3.30
Package Size (mm x mm)
3.2x2.5
包装高度（mm）
0.75
Output Drive Strength*
Default
Feature Pin
Output Enable
拉力范围（PPM PR）
药方：
传播百分比
药方：
Swing Select
药方：
DC-Coupled Output VOL or AC Swing
药方：
DC-Coupled Output VOH
药方：
RoHS
是的

*See datasheet for details

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Tape & Reel Options
X = 1,500 ct
  • 小型工业标准封装使小型系统具有严格的抖动要求
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    小型工业标准封装使小型系统具有严格的抖动要求

  • SiT9365型pin assignments
    enlarge

    SiT9365型pin assignments

  • SiT9365型block diagram
    enlarge

    SiT9365型block diagram

在实际操作条件下具有优异的动态性能

  • 0.23 ps抖动（典型值）
  • ±10 ppm
  • Better system performance in hostile environments

20x better vibration sensitivity

  • Minimizes packet loss in high-vibration environments

0.05 ps/mV power supply noise rejection (PSNR)

  • Simplify power supply design

3.2 x 2.5 mm package:

  • Enables small form-factor system with stringent jitter requirement

灵活的可编程功能

  • 32 common frequencies
  • 2.25 to 3.63 V
  • LVPECL, LVDS, HCSL: Customized oscillator specifications for optimal system performance

Superior reliability

  • 10亿小时MTBF
  • 终身保修
  • Reduces field failures due to clock components and associated repair costs

  • 10G to 100G Ethernet
  • Optical modules
  • PCIe
  • FPGA
  • SATA/SAS接口
  • Fibre channel
  • System clocking
  • CPE & home gateway
  • Data centers

Narrow By:

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坐93XX DEXO, SiT33XX VCXO, SiT335X DCXO Product Qualification Report 可靠性报告
6L / 10L-QFN包B，C和E资质报告 - ASE 可靠性报告
TSMC Wafer SGS Report RoHS/Reach/Green Certificates
Tower Jazz Wafer SGS Report RoHS/Reach/Green Certificates
4L / 6L-QFN封装均质材料和SGS报告 RoHS/Reach/Green Certificates
BOSCH Wafer SGS Report RoHS/Reach/Green Certificates
WLCSP Package Homogeneous Materials and SGS Report RoHS/Reach/Green Certificates
6L-QFN封装B和E（Elite Dexo，Vcxo）同质材料和SGS报告 RoHS/Reach/Green Certificates
sitEnvironmental Compliance Declaration RoHS/Reach/Green Certificates
Certificate of Compliance-EU RoHS Declaration RoHS/Reach/Green Certificates

Eval Boards(Contact SiTime)– SiT6097 (3225) | SiT6085 (7050)

频率斜率（dF/dT）计算器- 计算频率斜率超过温度

Jitter Calculator and Plots– Convert phase noise to phase jitter, find phase noise plots

可靠性计算器– Get FIT/MTBF data for various operating conditions

3225 6针|5032 6-Pins with CP|7050 6针带CP– Preview packages with QFN3D step models

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Elite Precision Super-TCXOs for 5G, Small Cell and Time Synchronization (Chinese) 产品简介
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MEMS振荡器在电机控制应用中提高可靠性和系统性能 白皮书
MEMS-Based Resonators and Oscillators are Now Replacing Quartz 演示文稿
与MEMS联系：机电接口 演示文稿
SiT9365产品介绍 数据表
J-AN10006 発振器のPCBデザインのガイドライン Application Notes
AN10007时钟抖动定义和测量方法 Application Notes
J-AN10007型クロックジッタの定義と測定方法 Application Notes
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微机电系统および水晶ベース発振器の電磁場感受率の比較 科技论文
Electromagnetic Susceptibility Comparison of MEMS and Quartz-based Oscillators 科技论文
MEMS発振器と水晶発振器の性能比較（耐衝撃と耐振動） 科技论文
Shock and Vibration Comparison of MEMS and Quartz-based Oscillators 科技论文
J-AN10033型発振器の周波数測定ガイドライン Application Notes
シリコンMEMS発振器材のおよび函数性 科技论文
硅MEMS振荡器的弹性和可靠性 科技论文
sitの MEMS First™ プロセス技術 科技论文
MEMS Resonator Advantages - How MEMS Resonators Work Part 2 演示文稿
如何在精密定时应用中测量长期抖动和周期间抖动 演示文稿
Silicon MEMS Oscillator Frequency Characteristics and Measurement Techniques 演示文稿
SiT9365型25MHz HCSL Freq. Test Reports
SiT9365 30.72兆赫HCSL Freq. Test Reports
SiT9365 50MHz HCSL Freq. Test Reports
SiT9365型53.125MHz HCSL Freq. Test Reports
SiT9365型61.44MHz HCSL Freq. Test Reports
SiT9365型98.304MHz HCSL Freq. Test Reports
SiT9365 100MHz HCSL Freq. Test Reports
SiT9365型106.25MHz HCSL Freq. Test Reports
SiT9365型122.88MHz HCSL Freq. Test Reports
SiT9365型125MHz HCSL Freq. Test Reports
SiT9365型133.333333MHz HCSL Freq. Test Reports
SiT9365型148.351648MHz HCSL Freq. Test Reports
SiT9365型150MHz HCSL Freq. Test Reports
SiT9365型153.6MHz HCSL Freq. Test Reports
SiT9365型155.52MHz HCSL Freq. Test Reports
SiT9365 156.25兆赫HCSL Freq. Test Reports
SiT9365型159.375MHz HCSL Freq. Test Reports
SiT9365型160MHz HCSL Freq. Test Reports
SiT9365型161.132813MHz HCSL Freq. Test Reports
SIT9365 166.666666MHz HCSL Freq. Test Reports
SiT9365型168.040678MHz HCSL Freq. Test Reports
SiT9365型200MHz HCSL Freq. Test Reports
SiT9365 212.5MHz HCSL Freq. Test Reports
SiT9365型250MHz HCSL Freq. Test Reports
SiT9365 300 mhz HCSL Freq. Test Reports
SiT9365型322.265625MHz HCSL Freq. Test Reports
SiT9365型325MHz HCSL Freq. Test Reports
SiT9365型30.72MHz LVDS Freq. Test Reports
SiT9365型53.125MHz LVDS Freq. Test Reports
SiT9365型61.44MHz LVDS Freq. Test Reports
SiT9365型62.5MHz LVDS Freq. Test Reports
SiT9365型74.25MHz LVDS Freq. Test Reports
SiT9365 74.175824MHz LVDS Freq. Test Reports
SiT9365型75MHz LVDS Freq. Test Reports
SiT9365 77.76MHz LVDS Freq. Test Reports
SiT9365型98.304MHz LVDS Freq. Test Reports
SiT9365型100MHz LVDS Freq. Test Reports
SiT9365型106.25MHz LVDS Freq. Test Reports
SiT9365型122.88MHz LVDS Freq. Test Reports
SiT9365 125MHz LVDS Freq. Test Reports
SiT9365型133.333333MHz LVDS Freq. Test Reports
SiT9365 148.351648MHz LVDS Freq. Test Reports
SiT9365 150MHz LVDS Freq. Test Reports
SiT9365 153.6MHz LVDS Freq. Test Reports
SiT9365 155.52兆赫LVDS Freq. Test Reports
SiT9365型156.25MHz LVDS Freq. Test Reports
SiT9365 159.375MHz LVDS Freq. Test Reports
SiT9365型160MHz LVDS Freq. Test Reports
SiT9365 161.132813MHz LVDS Freq. Test Reports
SiT9365型166.666666MHz LVDS Freq. Test Reports
SiT9365 168.040678MHz LVDS Freq. Test Reports
SiT9365型200MHz LVDS Freq. Test Reports
SiT9365型212.5MHz LVDS Freq. Test Reports
SiT9365型250MHz LVDS Freq. Test Reports
SiT9365 300MHz LVDS Freq. Test Reports
SIT9365 322.265625MHz LVDS. Freq. Test Reports
SiT9365 325MHz LVDS Freq. Test Reports
SiT9365型25MHz LVPECL Freq. Test Reports
SiT9365型30.72MHz LVPECL Freq. Test Reports
SiT9365型50MHz LVPECL Freq. Test Reports
SiT9365型53.125MHz LVPECL Freq. Test Reports
SiT9365型61.44MHz LVPECL Freq. Test Reports
SIT9365 62.5MHz LVPECL. Freq. Test Reports
SiT9365型74.25MHz LVPECL Freq. Test Reports
SiT9365型74.175824MHz LVPECL Freq. Test Reports
SiT9365 75MHz LVPECL Freq. Test Reports
SiT9365 77.76MHz LVPECL Freq. Test Reports
SiT9365型98.304MHz LVPECL Freq. Test Reports
SiT9365 100MHz LVPECL Freq. Test Reports
SiT9365型106.25MHz LVPECL Freq. Test Reports
SiT9365 122.88兆赫LVPECL Freq. Test Reports
SiT9365 125 mhz LVPECL Freq. Test Reports
SiT9365 133.333兆赫LVPECL Freq. Test Reports
SIT9365 148.351648MHz LVPECL. Freq. Test Reports
SiT9365型150MHz LVPECL Freq. Test Reports
SiT9365型153.6MHz LVPECL Freq. Test Reports
SiT9365 155.52兆赫LVPECL Freq. Test Reports
SiT9365型156.25MHz LVPECL Freq. Test Reports
SiT9365型159.375MHz LVPECL Freq. Test Reports
SIT9365 160MHz LVPECL. Freq. Test Reports
SiT9365型161.132813MHz LVPECL Freq. Test Reports
SiT9365 166.666666 mhz LVPECL Freq. Test Reports
SIT9365 168.040678MHz LVPECL. Freq. Test Reports
SiT9365型200MHz LVPECL Freq. Test Reports
SiT9365型212.5MHz LVPECL Freq. Test Reports
SiT9365 250MHz LVPECL Freq. Test Reports
SiT9365 300MHz低压电器 Freq. Test Reports
SiT9365型322.265625MHz LVPECL Freq. Test Reports
SiT9365 325MHz LVPECL Freq. Test Reports
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SC-AN10007型时钟抖动定义与测量方法 Application Notes
Timing Solutions for Communications & Enterprise Brochures/Fliers
相位噪声测量教程 视频
SiT9365型(HCSL, 3.3 V) IBIS Models
SIT9365（HCSL，2.5 V） IBIS Models
SiT9365型(LVDS, 3.3 V) IBIS Models
SiT9365（LVDS，2.5伏） IBIS Models
SiT9365型(LVPECL, 3.3 V) IBIS Models
SiT9365型(LVPECL, 2.5 V) IBIS Models
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sitMEMS Oscillators - Revolutionizing the Timing Market 视频
Jitter Part 1: Principles and Practice with an Overview of Period Jitter 视频
Jitter Part 2: Phase Noise and Phase Jitter 视频
Jitter Part 3: C2C Jitter and Long Term Jitter 视频
QFN 3225 6-Pins 3D Step Models
QFN 5032 6-Pins with CP 3D Step Models
QFN 7050 6-Pins with CP 3D Step Models
AN10066 LVDS输出，600 mV为1200 mV挥杆 Application Notes
Timing Solutions for Industrial Brochures/Fliers
Smart Network Interface Card (NIC) and IEEE1588 Application Briefs
100G/200G/400G/800G光模块 Application Briefs
用于光模块的SiTime MEMS时序解决方案 视频
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SiTime MEMS优先工艺 科技论文
AN10073 How to Setup a Real-time Oscilloscope to Measure Jitter Application Notes
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AN10070 Computing TIE Crest Factors for Non-telecom Applications Application Notes
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AN10074 Removing Oscilloscope Noise from RMS Jitter Measurements Application Notes

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