Download the Frequency Test Report to get performance data for oscillators operating at specific frequencies and output formats.
These reports include measured data for devices with different supply voltages such as: frequency stability over temperature, frequency slope, frequency hysteresis over temperature, Allan deviation, MTIE, TDEV, phase noise, output frequency power supply sensitivity, output frequency load sensitivity, output waveforms, pull range linearity, random phase jitter, duty cycle, rise/fall time, amplitude, and current consumption.
Many SiTime oscillators can be programmed to a very wide range of specifications, including frequency, output formats, and supply voltages. Because of the large potential combinations of parameters, SiTime provides frequency-specific test reports to supplement datasheet information, which include performance data typically measured at one sample frequency.
These reports include measured data for devices with different supply voltages such as: frequency stability over temperature, frequency slope, frequency hysteresis over temperature, Allan deviation, MTIE, TDEV, phase noise, output frequency power supply sensitivity, output frequency load sensitivity, output waveforms, pull range linearity, random phase jitter, duty cycle, rise/fall time, amplitude, and current consumption.
Many SiTime oscillators can be programmed to a very wide range of specifications, including frequency, output formats, and supply voltages. Because of the large potential combinations of parameters, SiTime provides frequency-specific test reports to supplement datasheet information, which include performance data typically measured at one sample frequency.
