Download the Frequency Test Report to get performance data for oscillators operating at specific frequencies and output formats.
These reports include measured data for devices with different supply voltages such as: frequency stability over temperature, phase noise, integrated phase jitter, RMS period Jitter, peak-to-peak period jitter, duty cycle, rise/fall time, differential output swing, and supply current.
Many SiTime oscillators can be programmed to a very wide range of specifications, including frequency, output formats, and supply voltages. Because of the large potential combinations of parameters, SiTime provides frequency-specific test reports to supplement datasheet information, which include performance data typically measured at one sample frequency.
These reports include measured data for devices with different supply voltages such as: frequency stability over temperature, phase noise, integrated phase jitter, RMS period Jitter, peak-to-peak period jitter, duty cycle, rise/fall time, differential output swing, and supply current.
Many SiTime oscillators can be programmed to a very wide range of specifications, including frequency, output formats, and supply voltages. Because of the large potential combinations of parameters, SiTime provides frequency-specific test reports to supplement datasheet information, which include performance data typically measured at one sample frequency.
